Past Gakuyugo Seminar |

AY2016 2nd Gakuyugo Seminar

Date&Time :
May 25, 2016 16:50 - 18:35
Venue :
Large Lecture Room (2C0), New Frontier Science Bldg.
Professor Yoshikazu Oya

Awakening Sake Yeast

Professor Yoshikazu Oya

Single cell phenomics of Saccharomyces cerevisiae is a powerful approach to investigate strain-to-strain and cell-to-cell diversity in an unbiased and statistical way. We applied this technique to sake yeast strains to investigate their diversification during the breeding process. Strain-to-strain comparison revealed that the sake yeast population was diverse compared with S. cerevisiae in general. We also observed an association between morphological profiles and genotypes. Comparison with the lineage map revealed that cross breeding had more profound effects on morphology than mutation breeding. Cell- to-cell diversity revealed that robustness was perturbed in some sake yeast strains, resulting in impairment of important intracellular systems. Thus, our high-dimensional, single-cell phenotyping provides valuable information on the breeding of sake yeast, which will be useful for future studies of breeding strategies in other microorganisms.

Associate Professor Yoshiaki Akutsu

Diverse sources of environmental impact substances

Associate Professor Yoshiaki Akutsu

 Various chemical substances are emitted into the environment from nature and human activities. There are various sources of substances that affect the environment. For example, a significant amount of methane, a greenhouse gas, is produced by agriculture, i.e., rice farming and cattle raising. Nitrogen oxides, which are mostly produced from the combustion of fossil fuels, are also produced by lightning in nature. This presentation will introduce the various sources of these environmental impact substances.

Associate Professor Yoshiaki Sugimoto

Ultra-high resolution measurement and atomic manipulation using an atomic force microscope

Associate Professor Yoshiaki Sugimoto

 Atomic force microscopy (AFM) is a microscopic technique for measuring surfaces of various materials, including insulators, with atomic resolution, in which a sharp needle is brought close to a sample and the interaction force between atoms at the tip of the needle and atoms on the sample surface is measured to obtain local information under the needle.  In this presentation, we will introduce our research on atomic resolution observation of various surfaces, elemental identification of individual atoms, and ultimate microfabrication by atomic manipulation in ultra-high vacuum.

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